Two AI-driven contributions from Nobleo at DSPE Conference

This year’s Dutch Society for Precision Engineering Conference programme features two contributions from our team, both centred around machine learning in high-tech environments.

🔹 Approximating model-predictive controllers using neural networks
Presented by Jeroen Willems and Edward Kikken, in collaboration with Flanders Make. We explore how neural networks can validate predictive control strategies in real-world mechatronic systems. A step towards smarter, data-driven system behaviour.

🔹 Automated wafer inspection with machine learning
Presented by Yanick Douven, Stefan van der Palen and Rik Wetzels. We demonstrate a two-step model for photonic wafer inspection: anomaly detection combined with object classification, developed and validated with two photonic foundries.

Both talks take place in the Machine Learning session on 23 September at De Ruwenberg Hotel. We look forward to see you there, to share our work and exchange ideas!

#dspe2025 #machinelearning #mechatronics #waferinspection #predictivecontrol #photonics #brainport #letsoutsmarttomorrow